WebIn this work, a sulfidization mechanism of malachite was confirmed based on the depth profile product, principal component, and depth profile curve analyses of time-of-flight secondary ion mass spectrometry (TOF-SIMS). The results showed that Cu/S species, including fragment ion peaks of Cu2S+, Cu3S+, S−, HS−, S2−, CuS2−, and … WebJan 15, 2024 · Introduction. In the past decade, large gas cluster ion beams (GCIBs) using mostly Ar 250-10000 + clusters rapidly became very popular in secondary ion mass spectrometry (SIMS) as a universal sputter source for organic and polymer-based materials [1], [2], [3], in a large spectrum of applications ranging from electronic devices [4], [5] to …
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WebAngerer, T. B., Magnusson, Y., Landberg, G., & Fletcher, J. S. (2016). Lipid Heterogeneity Resulting from Fatty Acid Processing in the Human Breast Cancer ... WebINIS Repository Search provides online access to one of the world's largest collections on the peaceful uses of nuclear science and technology. The International Nuclear Information System is operated by the IAEA in collaboration with over 150 members. java cafe city of industry
Lipid Heterogeneity Resulting from Fatty Acid Processing in the …
WebSep 25, 2024 · Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies. This technique is based on high spatial resolution (50–100 nm), high surface sensitivity (1–2 nm top-layer), and statistical analytic power. In mass spectrometry imaging (MSI), sample preparation … WebNov 9, 2016 · Europe PMC is an archive of life sciences journal literature. WebSep 4, 2015 · GCIB-TOF-SIMS is a method of analysis used to determine the depth profile of substances in an organic material. The analysis is performed by TOF-SIMS while etching the surface with an argon GCIB. The merit of etching with a GCIB is less damage to the substances than etching with an argon ion beam. If the etching is performed with an … java cafe fort leavenworth